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공지사항

Atomic Force Microscope I (Seiko AFM)

equipment explanation
Model E-Sweep W/NanoNaviStation
Operating time SUN(00:00~24:00)
MON(00:00~24:00)
TUE(00:00~24:00)
WED(00:00~24:00)
THU(00:00~24:00)
FRI(00:00~24:00)
SAT(00:00~24:00)
Location 86198
inquiry Lee, Sung-gyu / Suar Oh
LSG 010-7666-6655 / S.O 010-7176-9644
sg9662@skku.edu / saoh30@skku.edu
Reservation

Notice


Suar Oh (assists all other users)


Michael Neumann (assists users from Group 1)


18.03.21 ~ 18.04.01 Movement finished.


17.07.04 Tues~ 17.07.06 Maintenance finished.


16.05.01 Notice has renewed.


21.02.10 The machine was moved from 86391 to 86198. The machine is under maintenance.


@@@@@@ Notice @@@@@@


1. Reservation time has limit 48 hours.


2. Over 48 hours reservation, Contact Superuser. Please be aware.


3. For using this instruments, you have to get education before using. Please contact superuser.


4. Experimental information must be included in the reservation as below
Reservation Form
1. Measurement mode (ex. KFM)
2. Vacuum(ex. HV)
3. Working Temperature (ex. 200'C)
4. Co-worker (ex. with Gil-Dong Hong)

Atomic force microscopy is general term for a microscope that performs material analysis and surface topography observation of microscopic areas using a probe that scans near the sample surface and detects the physical characteristics


20 x 20 μm scanner (unavailable for now)
150 x 150 μm scanner
Vacuum : low 10-6 torr
Substrate temperature: -120 ~ 300 ℃
Low current amplifier : 100 fA


Magnetic force microscopy(MFM)
Current atomic force microscopy(C-AFM)
Lateral force microscopy(LFM)
Contact and non-contact mapping
Scanning tunneling microscopy(STM)
Nanolithography
In situ I-V measurement
Scanning thermal microscopy(SThM)
Scanning nonlinear dielectric microscopy(SNDM)
Kelvin probe force microscopy(KPFM)/Scanning Maxwell Stress Microscopy(SMM)